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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Libro
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2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005International Integrated Reliability Workshop Corporate Author ; IEEE Reliability Society Content Provider; IEEE Electron Devices Society Content Provider; International Integrated Reliability WorkshopAccesso online |
| 2 |
Material Type: Libro
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2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006International Integrated Reliability Workshop Corporate Author ; IEEE Reliability Society Content Provider; IEEE Electron Devices Society Content Provider; International Integrated Reliability WorkshopAccesso online |
| 3 |
Material Type: Libro
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2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003International Integrated Reliability Workshop Corporate Author ; IEEE Reliability Society Content Provider; IEEE Electron Devices Society Content Provider; International Integrated Reliability WorkshopAccesso online |
| 4 |
Material Type: Libro
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1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995International Integrated Reliability Workshop Corporate Author ; IEEE Electron Devices Society Content Provider; IEEE Reliability Society Content Provider; International Integrated Reliability WorkshopAccesso online |
| 5 |
Material Type: Libro
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1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998International Integrated Reliability Workshop Corporate Author ; IEEE Reliability Society Content Provider; IEEE Electron Devices Society Content Provider; International Integrated Reliability WorkshopAccesso online |
| 6 |
Material Type: Libro
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2007 IEEE International Integrated Reliability Workshop Final Report : 15-18 October 2007, S. Lake Tahoe, CA, USAInternational Integrated Reliability Workshop Final Report (2007 : S. Lake Tahoe, Calif.) ; IEEE Electron Devices Society, sponsoring body.Accesso online |
| 7 |
Material Type: Libro
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1991 proceedingsInternational Conference on Wafer Scale Integration Corporate Author ; Little, Michael J Contributor; Jain, Vijay K Contributor; IEEE Computer Society Content Provider; IEEE Components, Hybrids, and Manufacturing Technology Society Content Provider; International Conference on Wafer Scale IntegrationAccesso online |
| 8 |
Material Type: Libro
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2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002International Integrated Reliability Workshop Corporate Author ; IEEE Reliability Society Content Provider; IEEE Electron Devices Society Content Provider; International Integrated Reliability WorkshopAccesso online |
| 9 |
Material Type: Libro
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1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997International Integrated Reliability Workshop Corporate Author ; IEEE Reliability Society Content Provider; IEEE Electron Devices Society Content Provider; International Integrated Reliability WorkshopAccesso online |
| 10 |
Material Type: Libro
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1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994International Integrated Reliability Workshop Corporate Author ; IEEE Reliability Society Content Provider; IEEE Electron Devices Society Content Provider; International Integrated Reliability WorkshopAccesso online |
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